Since the failure analysis blog is written primarily for the benefit of our readers, we feel that it’s appropriate to ask whether we’ve met goal of providing a clear, concrete view of what we do (and, more importantly, how we do it). Have we successfully illuminated the intricacies of failure analysis? Have we covered the subjects we’ve explored in enough depth to offer insight into the process of testing, isolating, and finally revealing the defect? Most importantly, have we managed to simplify our process, so that even someone unfamiliar with failure analysis can walk away knowing something new? In order to best serve our customers, we need to know whether or not we’ve been effective in navigating the pitfalls of describing our processes.
We welcome any comments, suggestions for new topics, and, yes, even criticisms of the failure analysis blog. At IAL, we strive to provide defect free services, on time, every time – this even extends to the electronics FA blog. If you have any suggestions or are interested in learning more about any of the topics covered, please feel free to contact us – we always look forward to hearing from you and hope to establish a mutually beneficial working relationship.
Derek Snider is a failure analyst at Insight Analytical Labs, where he has worked since 2004. He is currently an undergraduate student at the University of Colorado, Colorado Springs, where he is pursuing a Bachelors of Science degree in Electrical Engineering.