Derek Snider at dual beam stage with star wars R2D2 toy

Semiconductor and Electronic Failure Analysis Blog

Welcome to the Semiconductor and Electronics Failure Analysis Blog, and discussion forum for all things related to electrical, integrated circuit (IC) board and electronics failure analysis.  Please subscribed to our feed and feel free to leave a comment or question. Thanks for visiting.

Electronic Failure Analysis - Fourier Transform InfraRed

Colorado Springs’ own Insight Analytical Labs (IAL), a world renown electronics failure analysis lab, is now offering a new material analysis service, FTIR (Fourier Transform InfraRed). This technique is used to determine the chemical composition of organic materials, such as oils, fluxes, (add more).

FTIR is based on the exposure of the electronic component sample to the IR spectrum, effectively providing a “fingerprint” (see inset) of the material as the IR light is either absorbed or reflected. This fingerprint can then be run against a database of over 50,000 organic materials, much like facial recognition programs seen on many law enforcement television shows. Samples can be as small as 10x10 square microns (a micron is a millionth of a meter, about a tenth the diameter of a hair).

IAL started in Colorado Springs and just celebrated its 24th year in business. Located in northern Colorado Springs, just off of Interquest Parkway and I-25, IAL offers its extensive list of services to the electronic manufacturing, aerospace, biomedical, military, intellectual property (IP), and original equipment manufacturing market segments. IAL’s clients cover North America, Asia, and Europe.

Read 9427 times

Search Our Site

ISO-9001:2007 Certified


Need to Determine the Root Cause of a Failure in an Electronic Component?  We get back to you with a quote in 24 hours once we have your information.

Request Failure Analysis Quote