Emission Microscopy Electronic Failure Analysis

Emission microscopy (EMMI) is an efficient optical analysis techniques used to detect and localize certain integrated circuit (IC) failures.

Emission microscopy (EMMI) is an efficient optical analysis techniques used to detect and localize certain integrated circuit (IC) failures.

It is a non-invasive techniques performed from either the front or back of devices. Many device defects induce faint light emission in the visible and near infrared (IR) spectrum.

Emission microscopy uses a sensitive camera to view and capture these optical emissions, allowing Failure Analysts to detect and localize certain IC defects such as:

  • Over-current or ESD-induced damage

  • Ht electron susceptibility

  • Leakage current

  • Defective junctions

  • Forward-biased bipolar transistors

  • Latch-up

Emission microscopy is a powerful early-stage failure analysis techniques since they localize failures non-invasively and require little in the way of sample preparation.