Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) is a standard technique capable of imaging structures and materials at resolutions well beyond the limits of optical microscopy. The technique images surface topography with extreme depth of field. It is also used for Energy Dispersive X-ray (EDX) spectroscopy for element analysis.

It enables the examination of features through high-resolution imaging and the simultaneous acquisition of chemical and crystallographic information from sub-micron regions of the specimen.

Another advantage of using electron beams is the increase in depth of field compared to optical microscopy. This allows clear pictures of complicated topological features.