IC Failure Analysis
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Failure analysis of integrated circuits is
essential for improving the quality of the manufacturing
process and the OEM’s equipment. In the
former situation, the electronics component manufacturer
must be made aware of the weaknesses in the manufacturing
process in order to develop means of monitoring
and eliminating them.
As an OEM, knowing the
potential
failure mechanisms of the constituent components
allows for a more robust design and good Failure
Mode and Effects Analysis (FMEA). |
To properly perform failure analysis, the F/A engineer must have knowledge of:
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the component’s construction,
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the theory of its operation,
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the physics of possible failure mechanisms
-
proper failure analysis procedures.
In any valid failure analysis, the history of the failing component is first reviewed. This, along with any electrical test information, provides the basis for the failure analysis plan. A well-thought out plan is essential for good results and decreases the likelihood of incurring extraneous expenses for the customer.
Upon receipt of the device, the first step
of the plan usually involves verifying the customer’s
electrical and visual data; if the failure indicator
cannot be reproduced in the lab, a successful
F/A is unlikely. The next steps include the selection
and use of appropriate non-destructive methods
to identify or disprove theories for the possible
cause of the failure. For both of these steps,
it is essential to have a known good unit that
functions as a standard in order to properly
interpret
the F/A results. |
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Depending upon the initial findings, the failure analyst will then use the best tools to continue the investigation. These may include any combination of:
- Liquid crystal analysis
- Light emission microscopy
- Infrared inspection
- Dye penetration
- Electrical probing
- Cross sectioning
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- Radiography (X-ray imaging)
- Acoustic imaging
- SEM inspection
- TEM inspection
- Deprocessing (wet and dry)
- Surface analysis techniques (e.g., energy dispersive spectroscopy (EDS), Auger, etc.)
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