Emission Microscopy
 |
Emission microscopy (EMMI) is an efficient optical
analysis techniques used to detect and localize
certain integrated circuit (IC) failures.
It is
a non-invasive techniques performed from either
the front or back of devices. Many device defects
induce faint light emission in the visible
and near infrared (IR) spectrum. |
Emission microscopy uses a sensitive camera to view
and capture these optical emissions, allowing Failure
Analysts to detect and localize certain IC defects
such as:
-
Over-current or ESD-induced damage
-
Ht electron susceptibility
-
Leakage current
-
Defective junctions
-
Forward-biased bipolar transistors
-
Latch-up
|
 |
Emission microscopy is a powerful early-stage failure
analysis techniques since they localize failures non-invasively
and require little in the way of sample preparation. |
