Printed Circuits Defects - Analysis and Detection
- Created: Wednesday, 04 March 2015 17:12
A failure analysis lab employes a wide variety of techniques to search for defects in integrated circuits. Last week, we had seen what goes on inside a failure analysis lab and today we'll take a look at the different types of printed circuits defects and what class of methods are used to analyze them. It should be noted that any printed circuits defects analysis is preceded by a thorough examination of the facts accompanying the detection of the failure and only after the engineers know what they're looking for, do they settle down to apply specific failure analysis techniques.