The humble capacitor is one of the most fundamental components of any electronic assembly. These ubiquitous passive devices come in a variety of different flavors; whether formed using electrolytic fluids, metal foils, the metals and oxides of an integrated circuit, or any of a multitude of other materials, there is hardly a printed circuit assembly in the world without at least one capacitor mounted somewhere on its surface. Capacitors form the backbone of charge pumps, frequency filters, power conditioners, and many other common applications; since these components are so crucial to these operations, a malfunctioning capacitor can often cause complete failure of a system. At first blush, a capacitor would seem to be a fairly straightforward device to perform analysis on (after all, how complex can two electrodes separated by a thin dielectric be?), capacitor failure analysis poses unique challenges that must be met with equally unique approaches.